Specialists in charged particle imaging equipment, we have experience in the full range of FEI (ThermoFisher) instruments: FIB, SEM, and Dual Beams. We also perform computer upgrades and provide expert troubleshooting and component-level fault repair as well as preventative maintenance and delicate Instrument moves.
Supported Microscopes
Full range of Philips and FEI XL and XT based equipment
Dual Beam
FEI DB 620,820, 235, 830,860,835, 865, Quanta, Nova
SEM
XL20,30,40,50 Tungsten, LaB6, FEG, Quanta
FIB
FEI FIB 610/611, 200, 800 Ionmill, XP, Vectra
